|
Volumn 44, Issue 14, 2003, Pages 3769-3773
|
Annealing effects on thickness of polystyrene thin films as studied by neutron reflectivity
|
Author keywords
Glass transition; Negative expansivity; Polymer thin film
|
Indexed keywords
ANNEALING;
GLASS TRANSITION;
NEUTRON REFLECTION;
POLYSTYRENES;
RELAXATION PROCESSES;
SILICON;
NEGATIVE EXPANSIVITY;
PLASTIC FILMS;
DEUTERIUM;
POLYSTYRENE;
ARTICLE;
FILM;
GLASS TRANSITION TEMPERATURE;
HEATING;
MEASUREMENT;
REFLECTOMETRY;
STRUCTURE ANALYSIS;
THICKNESS;
ANNEALING;
FILM;
POLYSTYRENE;
THICKNESS;
|
EID: 0037835448
PISSN: 00323861
EISSN: None
Source Type: Journal
DOI: 10.1016/S0032-3861(03)00309-4 Document Type: Article |
Times cited : (85)
|
References (27)
|