Thickness dependence of the dynamics in thin films of isotactic poly (methylmethacrylate)

European Physical Journal E

Volumn 12, Issue SUPPL. 1, 2003, Pages 85-89

  Sharp, J S ^a,b   Forrest, J A ^a  

^a UNIVERSITY OF WATERLOO   (Canada)

^b UNIVERSITY OF NOTTINGHAM   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; ELLIPSOMETRY; POLYMETHYL METHACRYLATES; RELAXATION PROCESSES; SUBSTRATES; THICK FILMS;

ALPHA RELAXATION; DYNAMIC CORRELATION; SILICON SUBSTRATES;

THIN FILMS;

EID: 24344503749     PISSN: 12928941     EISSN: None     Source Type: Journal    
DOI: 10.1140/epjed/e2003-01-023-3     Document Type: Article

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