Short-time piezoelectric measurements in ferroelectric thin films using a double-beam laser interferometer

Review of Scientific Instruments

Volumn 74, Issue 4, 2003, Pages 2613-2615

  Gerber, P ^a   Roelofs, A ^a   Lohse, O ^a   Kugeler C ^a   Tiedke, S ^a   Bottger U ^a   Waser, R ^a  

^a RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

FERROELECTRIC MATERIALS; HYSTERESIS; INTERFEROMETERS; LASER BEAMS; MATHEMATICAL MODELS; PIEZOELECTRICITY; STRESS ANALYSIS;

ELECTRICAL STRESS;

FERROELECTRIC THIN FILMS;

EID: 0038341784     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1544415     Document Type: Article

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