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Volumn 303, Issue , 2013, Pages 23-27

Molecular dynamics study of polystyrene bond-breaking and crosslinking under C60 and Arn cluster bombardment

Author keywords

Cluster SIMS; Crosslinking; Desorption; Molecular depth profiling; Molecular dynamics; Polystyrene

Indexed keywords

ATOMS; CROSSLINKING; DEPTH PROFILING; DESORPTION; POLYSTYRENES;

EID: 84884812302     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2012.11.030     Document Type: Article
Times cited : (19)

References (22)
  • 11
    • 0001426801 scopus 로고    scopus 로고
    • J.C. Vickerman, D. Briggs (Eds.), Surface Spectra, Manchester, U.K.
    • B.J. Garrison, in: J.C. Vickerman, D. Briggs (Eds.), TOF-SIMS Surface Analysis by Mass Spectrometry, Surface Spectra, Manchester, U.K., 2001, p. 223.
    • (2001) TOF-SIMS Surface Analysis by Mass Spectrometry , pp. 223
    • Garrison, B.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.