Broadband terahertz analysis of energetic materials - Influence of crystal structure and additives

IEEE Transactions on Terahertz Science and Technology

Volumn 3, Issue 5, 2013, Pages 649-655

  Huhn, Anna K ^a   Saenz, Elena ^b   De Maagt, Peter ^b   Bolivar, Peter Haring ^a  

^a UNIVERSITY OF SIEGEN   (Germany)

^b EUROPEAN SPACE AGENCY   (Netherlands)

Author keywords

Broadband terahertz (THz) spectroscopy; energetic materials; security application; spectral fingerprints

Indexed keywords

BROADBAND TERAHERTZ; FLAT FREQUENCY RESPONSE; MANUFACTURING PROCESS; POWDER X RAY DIFFRACTION; SECURITY APPLICATION; SPECTRAL FINGERPRINTS; SPECTROSCOPIC INVESTIGATIONS; THZ TIME DOMAIN SPECTROSCOPY;

EXPLOSIVES; RESONANCE; SPECTROSCOPY; TIME DOMAIN ANALYSIS; X RAY DIFFRACTION;

TERAHERTZ SPECTROSCOPY;

EID: 84884749088     PISSN: 2156342X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TTHZ.2013.2265602     Document Type: Article

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