Spectroscopic characterization of explosives in the far infrared region

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5411, Issue , 2004, Pages 1-8

  Chen, Yunqing ^a   Liu, Haibo ^a   Deng, Yanqing ^a   Veksler, Dmitry ^a   Shur, Michael ^a   Zhang, X C ^a   Schauki, Dunja ^b   Fitch, Michael J ^b   Osiander, Robert ^b   Dodson, Caroline ^c   Spicer, James B ^c  

^a RENSSELAER POLYTECHNIC INSTITUTE   (United States)

^b JOHNS HOPKINS UNIVERSITY   (United States)

^c Johns Hopkins University   (United States)

Author keywords

Explosive; Far infrared; FTIR; Spectroscopic characterization; THz TDS

Indexed keywords

FAR INFRARED; FOURIER TRANSFORM INFRARED SPECTROSCPOY (FTIR); SPECTROSCOPIC CHARACTERIZATION; THZ TIME-DOMAIN SPECTROSCOPY (TDS);

BOLOMETERS; DETECTORS; EXPLOSIVES; FAST FOURIER TRANSFORMS; HIGH TEMPERATURE EFFECTS; IMAGING TECHNIQUES; RADAR; TIME DOMAIN ANALYSIS;

SPECTROSCOPIC ANALYSIS;

EID: 10044277016     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.540945     Document Type: Conference Paper

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