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Volumn 21, Issue 19, 2013, Pages 22353-22366

Simultaneous measurement of the microscopic dynamics and the mesoscopic displacement field in soft systems by speckle imaging

Author keywords

[No Author keywords available]

Indexed keywords

SPECKLE; SUPERCONDUCTING MATERIALS;

EID: 84884560478     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.21.022353     Document Type: Article
Times cited : (34)

References (37)
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