Complete elliptical ring geometry provides energy and instrument calibration for synchrotron-based two-dimensional X-ray diffraction

Journal of Applied Crystallography

Volumn 46, Issue 5, 2013, Pages 1249-1260

  Hart, Michael L ^a   Drakopoulos, Michael ^a   Reinhard, Christina ^a   Connolley, Thomas ^a  

^a DIAMOND LIGHT SOURCE LTD   (United Kingdom)

Author keywords

instrument calibration; synchrotron radiation; X ray diffraction

Indexed keywords

CALIBRATION METHOD; CALIBRATION PROCEDURE; DIFFRACTION RINGS; INSTRUMENT CALIBRATIONS; POINT OF INTERSECTIONS; SAMPLE-TO-DETECTOR DISTANCE; TWO-DIMENSIONAL DETECTORS; TWO-DIMENSIONAL X-RAY DIFFRACTIONS;

CALIBRATION; ITERATIVE METHODS; SYNCHROTRON RADIATION; TWO DIMENSIONAL; X RAY DIFFRACTION;

DETECTORS;

EID: 84884555388     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889813022437     Document Type: Article

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