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Volumn 30, Issue 1, 1997, Pages 21-30

Synchrotron Powder Diffraction using Imaging Plates: Crystal Structure Determination and Rietveld Refinement

Author keywords

[No Author keywords available]

Indexed keywords


EID: 1842783147     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889896009995     Document Type: Article
Times cited : (142)

References (27)
  • 3
    • 85033133201 scopus 로고    scopus 로고
    • Baerlocher, C. (1982). Institut für Kristallographic und Petrogrographie, ETH, Zürich, Switzerland
    • Baerlocher, C. (1982). Institut für Kristallographic und Petrogrographie, ETH, Zürich, Switzerland.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.