Formation of Al nanostructures on Alq3: An in situ grazing incidence small angle X-ray scattering study during radio frequency sputter deposition

Journal of Physical Chemistry Letters

Volumn 4, Issue 18, 2013, Pages 3170-3175

  Yu, Shun ^a   Santoro, Gonzalo ^a   Sarkar, Kuhu ^b   Dicke, Benjamin ^a   Wessels, Philipp ^c   Bommel, Sebastian ^a,d   Döhrmann, Ralph ^a   Perlich, Jan ^a   Kuhlmann, Marion ^a   Metwalli, Ezzeldin ^b   Risch, Johannes F H ^a   Schwartzkopf, Matthias ^a   Drescher, Markus ^c   Müller Buschbaum, Peter ^b   Roth, Stephan V ^a  

^a DESY   (Germany)

^b TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^c UNIVERSITY OF HAMBURG   (Germany)

^d HUMBOLDT UNIVERSITY   (Germany)

Author keywords

GISAXS; interface; self assembly; sputtering; thin film morphology

Indexed keywords

GI-SAXS; GRAZING INCIDENCE SMALL-ANGLE X-RAY SCATTERING; NANOSTRUCTURE THIN FILMS; ORGANIC ELECTRONIC DEVICES; ORGANIC LIGHT-EMITTING DEVICES; RADIO FREQUENCY SPUTTER; THIN FILM MORPHOLOGY; TRIS(8HYDROXYQUINOLINATO) ALUMINUM (ALQ3);

DEPOSITION; FILM GROWTH; INTERFACES (MATERIALS); NANOSTRUCTURES; SCATTERING; SELF ASSEMBLY; SEMICONDUCTOR DEVICES; SPUTTERING; THIN FILMS; X RAY SCATTERING;

ALUMINUM;

EID: 84884539549     PISSN: None     EISSN: 19487185     Source Type: Journal    
DOI: 10.1021/jz401585d     Document Type: Article

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