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Volumn 117, Issue 36, 2013, Pages 18688-18696

Direct evidence of chemically inhomogeneous, nanostructured, Si-O buried interfaces and their effect on the efficiency of carbon nanotube/Si photovoltaic heterojunctions

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ETCHING; COMPLEX INTERFACE; IN-DEPTH PROFILING; LAYERED STRUCTURES; PHOTOEMISSION PROCESS; PHOTOEMITTED ELECTRONS; X RAY PHOTOEMISSION SPECTROSCOPY; X-RAY PHOTOEMISSIONS;

EID: 84884195234     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp404820k     Document Type: Article
Times cited : (26)

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