Measuring angular distributions with large-acceptance-angle detectors

Measurement Science and Technology

Volumn 12, Issue 3, 2001, Pages 299-305

  Waligorski, Grzegorz ^a,c   Cooke, W E ^b  

^a UNIVERSITY OF SOUTHERN CALIFORNIA   (United States)

^b Dept of Economics and Thomas Jefferson Program in Public Policy at the College of William and Mary   (United States)

^c Photobit Corp   (United States)

Author keywords

Electron angular distribution; Electron spectrometer

Indexed keywords

ELECTRON;

EID: 0035282602     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/12/3/308     Document Type: Article

References (7)