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Volumn , Issue , 2011, Pages 1-16

Advances in Electronic Structure Methods for Defects and Impurities in Solids

Author keywords

Calculation methods; Density functional theory; Electronic structure; Impurities; Point defects

Indexed keywords


EID: 84884073339     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1002/9783527638529.ch1     Document Type: Chapter
Times cited : (8)

References (76)
  • 10
    • 0004101812 scopus 로고
    • Springer-Verlag, Berlin; (1983) Point Defects in Semiconductors II: Experimental Aspects, Springer-Verlag, Berlin
    • Lannoo, M. and Bourgoin, J. (1981) Point Defects in Semiconductors I: Theoretical Aspects, Springer-Verlag, Berlin; (1983) Point Defects in Semiconductors II: Experimental Aspects, Springer-Verlag, Berlin.
    • (1981) Point Defects in Semiconductors I: Theoretical Aspects
    • Lannoo, M.1    Bourgoin, J.2
  • 12
    • 0004086809 scopus 로고    scopus 로고
    • Identification of Defects in Semiconductors, Semiconductors and Semimetals
    • 51B Academic, San Diego
    • Stavola, M. (ed.) (1999) Identification of Defects in Semiconductors, Semiconductors and Semimetals, vol. 51A, 51B Academic, San Diego.
    • (1999) , vol.51 A
    • Stavola, M.1
  • 71
    • 84884035905 scopus 로고    scopus 로고
    • Abstract Q23, American Physical Society Meeting, March 2010
    • Zhang, P. and Shih, B., Abstract Q23, American Physical Society Meeting, March 2010, http://meetings.aps.org/ Meeting/MAR10/Event/120825.
    • Zhang, P.1    Shih, B.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.