In situ Raman spectroscopy of topological insulator Bi2Te3 films with varying thickness

Nano Research

Volumn 6, Issue 9, 2013, Pages 688-692

  Wang, Chunxiao ^a,b   Zhu, Xiegang ^a   Nilsson, Louis ^c   Wen, Jing ^a   Wang, Guang ^a   Shan, Xinyan ^a   Zhang, Qing ^a   Zhang, Shulin ^b   Jia, Jinfeng ^a,d   Xue, Qikun ^a  

^a TSINGHUA UNIVERSITY   (China)

^b PEKING UNIVERSITY   (China)

^c AARHUS UNIVERSITY   (Denmark)

^d SHANGHAI JIAO TONG UNIVERSITY   (China)

Author keywords

in situ Raman spectroscopy; surface phonon mode; thin film; topological insulator

Indexed keywords

EID: 84883799179     PISSN: 19980124     EISSN: 19980000     Source Type: Journal    
DOI: 10.1007/s12274-013-0344-4     Document Type: Article

References (21)

1. Qi, X. L.; Zhang, S. C. The quantum spin Hall effect and topological insulators. Phys. Today2010, 63, 33-38.
2. Moore, J. E. The birth of topological insulators. Nature2010, 464, 194-198.
3. 3 with a single Dirac cone on the surface. Nat. Phys. 2009, 5, 438-442.
4. Hasan, M. Z.; Kane, C. L. Colloquium: Topological insulators. Rev. Mod. Phys. 2010, 82, 3045-3067.
5. 3 films: Applications in nanometrology of topological insulators. Appl. Phys. Lett. 2010, 96, 153103.
6. 3 nanoplatelets. Nano Lett. 2011, 11, 2407-2414.
7. 3. Phys. Rev. B2011, 84, 195118.
8. 3 nanocrystals. Appl. Phys. Lett. 2011, 98, 141911.
9. Dang, W. H.; Peng, H. L.; Li, H.; Wang, P.; Liu, Z. F. Epitaxial heterostructures of ultrathin topological insulator nanoplate and graphene. Nano Lett. 2010, 10, 2870-2876.
10. Russo, V.; Bailini, A.; Zamboni, M.; Passoni, M.; Conti, C.; Casari, C. S.; Bassi, A. L.; Bottani, C. E. Raman spectroscopy of Bi-Te thin films. J. Raman Spectrosc. 2008, 39, 205-210.
11. 3. Appl. Phys. Lett. 2009, 95, 053114.
12. Chen, C. Y.; He, S. L.; Weng, H. M.; Zhang, W. T.; Zhao, L.; Liu, H. Y.; Jia, X. W.; Mou, D. X.; Liu, S. Y.; He, J. F. et al. Robustness of topological order and formation of quantum well states in topological insulators exposed to ambient environment. P. Natl. Acad. USA. 2012, 109, 3694-3698.
13. 3 with controlled electronic structure. Adv. Mater. 2011, 23, 2929-2932.
14. Zhang, S. L. Raman Spectroscopy and its Application in Nanostructures; Wiley: Chichester, 2012.
15. 3 (0 < y < 1). Phys. Stat. Sol. (b)1977, 84, 619-628.
16. 3. Phys. Stat. Sol. (b)1984, 125, 131-138.
17. 2. J. Appl. Phys. 1994, 75, 1835-1836.
18. 3. New J. Phys. 2010, 12, 65013-65020.
19. Dolling, G. Inelastic Scattering Neutrons in Solids and Liquids; IAEA: Vienna, 1963; 2, pp37.
20. Tubino, R.; Piseri, L.; Zerbi, G. Lattice dynamics and spectroscopic properties by a valence force potential of diamondlike crystals: C, Si, Ge, and Sn. J. Chem. Phys. 1972, 56, 1022-1039.
21. 3 thin films on Si and their thickness limit. Adv. Mater. 2010, 22, 4002-4007.