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Volumn 7, Issue 9, 2013, Pages 739-745

Wide-field, high-resolution Fourier ptychographic microscopy

Author keywords

[No Author keywords available]

Indexed keywords

COMPLEX SAMPLES; HIGH RESOLUTION; HIGH-RESOLUTION MICROSCOPY; HIGH-THROUGHPUT; HISTOLOGY SLIDES; INTENSITY IMAGES; PHYSICAL LIMITATIONS; WAVEFRONT CORRECTION;

EID: 84883457396     PISSN: 17494885     EISSN: 17494893     Source Type: Journal    
DOI: 10.1038/nphoton.2013.187     Document Type: Article
Times cited : (1652)

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