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Surface and Interface Analysis

Volumn 44, Issue 11-12, 2012, Pages 1427-1430

Microstructural characterization of abnormal grain growth behavior of Al-doped ZnO in thin film solar cells

(5) Shin, Hui Youn a Joo, M H a Moon, S K a Moon, T H a Park, K H a

a LG Electronics Inc (South Korea)

Author keywords

Al doped ZnO; Solar cells; Transparent conducting oxides (TCOs)

Indexed keywords

ALUMINUM COMPOUNDS; CRYSTAL ORIENTATION; FAST FOURIER TRANSFORMS; FILM GROWTH; FLOW OF GASES; GRAIN GROWTH; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; II-VI SEMICONDUCTORS; IMAGE ANALYSIS; MICROSTRUCTURE; OPTICAL FILMS; OXIDE MINERALS; SOLAR CELLS; SUBSTRATES; THIN FILMS; TRANSPARENT CONDUCTING OXIDES; ZINC OXIDE;

ABNORMAL GRAIN GROWTH; AL-DOPED ZNO; COLUMNAR STRUCTURES; ENERGY DISPERSIVE X-RAY; GROWTH ORIENTATIONS; MICRO-STRUCTURAL CHARACTERIZATION; MICRO-STRUCTURAL PROPERTIES; PULSED MAGNETRON SPUTTERING;

THIN FILM SOLAR CELLS;

EID: 84882450463 PISSN: 01422421 EISSN: 10969918 Source Type: Journal
DOI: 10.1002/sia.4967 Document Type: Conference Paper

Times cited : (1)

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