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Volumn 117, Issue 32, 2013, Pages 16457-16467

Surface electronic structure and mechanical characteristics of copper-cobalt oxide thin film coatings: Soft X-ray synchrotron radiation spectroscopic analyses and modeling

Author keywords

[No Author keywords available]

Indexed keywords

COPPER CONCENTRATION; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; MECHANICAL CHARACTERISTICS; NANOMECHANICAL TESTING; NEAR-EDGE X-RAY ABSORPTION FINE STRUCTURE SPECTROSCOPIES; SOL-GEL DIP-COATING METHOD; SURFACE ELECTRONIC STRUCTURES; SYNCHROTRON RADIATION X-RAYS;

EID: 84882399572     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp404841m     Document Type: Article
Times cited : (35)

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