Copper-cobalt heterobimetallic ceramic oxide thin film deposition: Synthesis, characterization and application of precursor

Inorganic Chemistry Communications

Volumn 11, Issue 10, 2008, Pages 1159-1161

  Hamid, Mazhar ^a   Tahir, Asif Ali ^a   Mazhar, Muhammad ^a   Molloy, Kieran C ^b   Kociok Köhn, Gabriele ^b  

^a QUAID I AZAM UNIVERSITY   (Pakistan)

^b University of Bath Claverton Down   (United Kingdom)

Author keywords

Bimetallic cage; Copper cobalt oxide; CVD precursor; Mixed ceramic oxide

Indexed keywords

EID: 52949109169     PISSN: 13877003     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.inoche.2008.06.018     Document Type: Article

References (36)

1. Bednorz J.G., Muller K.A., and Takashige M. Science 236 (1987) 73
2. Edwerds P.P., Harrison M.R., and Jones R. Chem. Ber. 23 (1987) 962
3. Veith M., Mathur S., and Huch V. J. Am. Chem. Soc. 118 (1996) 903
4. Bradley D.C., Mehrotra R.C., and Gaur D.P. Metal Alkoxides (1978), Academic Press, London
5. Herrman W.A., Huber N.W., and Runte O. Angew. Chem. 107 (1995) 2371
6. Chi Y., Ranjan S., Chou T.Y., Liu C.S., Peng S.M., and Lee G.H. J. Chem. Soc., Dalton Trans. (2001) 2462
7. Breeze R.S., and Wang S. Inorg. Chem. 33 (1994) 5113
8. Hamid M., Tahir A.A., Mazhar M., Zeller M., Molloy K.C., and Hunter A.D. Inorg. Chem. 45 (2006) 10457
9. Hamid M., Tahir A.A., Mazhar M., Zeller M., and Hunter A.D. Inorg. Chem. 46 (2007) 4120
10. Hubert-Pfalzgraf L.G. Inorg. Chem. Commun. 6 (2003) 102
11. Amigo R., Asenjo J., Krotenko E., Torres F., and Tejada J. Chem. Mater. 12 (2000) 573
12. Rodriguez J.A., Hanson J.C., Chaturvedi S., Maiti A., and Brito J.L. J. Chem. Phys. 112 (2000) 935
13. Heinz D., Hoelderich W.F., Krill S., Boeck W., and Huthmacher K. J. Catal. 192 (2000) 1
14. Kiessling D., Went G., Hagenau K., and Schoellner R. Appl. Catal. 71 (1991) 69
15. Watanabe H., and Koyasu Y. Appl. Catal. A. 194-195 (2000) 479
16. Angelov S., Mehandjiev D., Piperov B., Zarkov V., Terlecki-Baricevic A., Jovanovic D., and Jovanovic Z. Appl. Catal. 16 (1985) 431
17. Fujimoto K., and Oba T. Appl. Catal. 13 (1985) 289
18. Xiaoding X., Doesburg E.B.M., and Sholten J.J.F. Catal. Today 2 (1987) 125
19. Baker J.E., Burch R., and Golunski S.E. Appl. Catal. 53 (1989) 279 and references therein
20. A. Sugier, E. Freund, US Patent 4122110, 1978.
21. Fornasari G., Gusi S., Trifir F., and Vaccari A. Ind. Eng. Chem. Res. 26 (1987) 1500 and references therein
22. Kawata S., Breeze S.R., Wang S., Greedan J.E., and Raju N.P. Chem. Commun. (1997) 717 and references therein
23. Yen-Hsiang L., Hui-Lien T., Lu Y., Wen Y., Wang J., and Lu K. Inorg. Chem. 40 (2001) 6426
24. Shova S.G., Novitskii G.V., Marzus M.D., and Gulya A.P. Proc. Natl. Acad. Sci., USA 337 (1994) 348
25. Chaudhuri P., Querbach J., and Wieghardt K. J. Chem. Soc., Dalton Trans. (1990) 271
26. Zhang J., Hubert-Pfalzgraf L.G., and Luneau D. Inorg. Chem. Commun. 7 (2004) 979
27. Calvo-Perez V., Ostrovsky S., Vega A., Pelikan J., Spodine E., and Haase W. Inorg. Chem. 45 (2006) 644
28. -1: 3385(br), 2964(w), 2898(w), 1683(s), 1464(m), 1385(m), 1205(s), 1143(s), 1078(w), 989(w), 844(m), 800(m), 725(m), 606(w), 523(w), 457(w). TGA: 300-365 °C (approximate residue of 27.0%).
29. Nawar N., and Hosny N.M. Transition Met. Chem. 25 (2000) 1-8
30. 2) 0.1138 [I > 2σ(I)].
31. Dey S.K., Shit S., Mitra S., Thompson L.K., and Malik M.A. Inorg. Chim. Acta 360 (2007) 1915-1920
32. Tahir A.A., Molloy K.C., Mazhar M., Kociok-Köhn G., Hamid M., and Dastgir S. Inorg. Chem. 44 (2005) 9207
33. ICDD powder diffraction database file card number [01-078-2176]
34. Petrov K., Krezhov K., and Konstantinov P. J. Phys. Chem. Solids 50 (1989) 577
35. ICDD powder diffraction database file card number [01-089-5896]
36. Massarotti V., Capsoni D., Bini M., Altomare A., and Moliterni A.G.G. Z. Kristallogr. 213 (1998) 259