Compositional dependence of the proton conductivity of anodic ZrO 2-WO3-SiO2 nanofilms at intermediate temperatures

Journal of the Electrochemical Society

Volumn 160, Issue 9, 2013, Pages

  Ye, Ke ^a   Aoki, Yoshitaka ^a   Tsuji, Etsushi ^a   Nagata, Shinji ^b   Habazaki, Hiroki ^a  

^a HOKKAIDO UNIVERSITY   (Japan)

^b TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ACID ELECTROLYTES; COMPOSITIONAL DEPENDENCE; CONDUCTIVITY DEGRADATIONS; DIFFERENT MECHANISMS; HIGH CONDUCTIVITY; INTERMEDIATE TEMPERATURES; POST-ANNEALING TEMPERATURE; THICKNESS DEPENDENCE;

ANNEALING; PROTON CONDUCTIVITY; SILICON; SILICON ALLOYS; SILICON OXIDES; THICK FILMS; ZIRCONIUM; ZIRCONIUM ALLOYS;

ANODIC OXIDATION;

EID: 84881500329     PISSN: 00134651     EISSN: 19457111     Source Type: Journal    
DOI: 10.1149/2.120309jes     Document Type: Article

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