Thickness dependence of proton conductivity of amorphous aluminosilicate nanofilm

Electrochemical and Solid-State Letters

Volumn 11, Issue 11, 2008, Pages

  Aoki, Yoshitaka ^a   Habazaki, H ^a,c   Kunitake, Toyoki ^b  

^a HOKKAIDO UNIVERSITY   (Japan)

^b NanoMembrane Technologies Incorporated   (Japan)

^c ELECTROCHEMICAL SOCIETY

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINOSILICATES;

AMORPHOUS ALUMINOSILICATE; NANO FILMS; THICKNESS DEPENDENCES;

ELECTRIC CONDUCTIVITY;

EID: 51849161566     PISSN: 10990062     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.2976305     Document Type: Article

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