Thickness dependence of proton conductivity of anodic ZrO 2-WO 3-SiO 2 nanofilms

Journal of Power Sources

Volumn 205, Issue , 2012, Pages 194-200

  Ye, Ke ^a   Aoki, Yoshitaka ^a   Tsuji, Etsushi ^a   Nagata, Shinji ^b   Habazaki, Hiroki ^a  

^a HOKKAIDO UNIVERSITY   (Japan)

^b TOHOKU UNIVERSITY   (Japan)

Author keywords

Amorphous materials; Anodic oxidation; Ion conducting materials; Nanofilms; Proton transport

Indexed keywords

ACID ELECTROLYTES; ANODIC OXIDE FILM; COMMERCIAL FUEL CELLS; ELECTROLYTE MEMBRANE; FORMATION VOLTAGE; ION CONDUCTING MATERIALS; NANO FILMS; PROTON TRANSPORT; THICKNESS DEPENDENCE; TUNGSTEN SPECIES; TWO LAYERS;

AMORPHOUS MATERIALS; AMORPHOUS SILICON; ELECTROLYTES; OXIDE FILMS; PHOSPHORIC ACID; PROTON CONDUCTIVITY; SILICON COMPOUNDS; SILICON OXIDES; TUNGSTEN; ZIRCONIUM; ZIRCONIUM ALLOYS;

ANODIC OXIDATION;

EID: 84857359491     PISSN: 03787753     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpowsour.2012.01.083     Document Type: Article

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