Size-scaling of proton conductivity in amorphous aluminosilicate acid thin films

Journal of the American Chemical Society

Volumn 131, Issue 40, 2009, Pages 14399-14406

  Aoki, Yoshitaka ^a   Habazaki, Hiroki ^a   Kunitake, Toyoki ^b  

^a HOKKAIDO UNIVERSITY   (Japan)

^b RIKEN   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ACID CENTERS; ACID SITE; ACIDIC PROTON; AMORPHOUS ALUMINOSILICATE; CLUSTER SIZES; DENSE FILMS; ELECTRODE SUBSTRATES; FINITE SIZE; GLASS MATRICES; LEWIS ACIDIC; MIXED PRECURSORS; NANO FILMS; NANOMETER THICKNESS; PERCOLATION SYSTEMS; POWER LOW; PROTONIC; SCALING INDEX; THICKNESS DIRECTION; XANES MEASUREMENTS;

ACIDS; ALUMINOSILICATES; MOISTURE; PROTON CONDUCTIVITY; SILICON COMPOUNDS; SOLVENTS; SULFUR COMPOUNDS; SURFACE CHEMISTRY; THERMAL DESORPTION; THERMAL DESORPTION SPECTROSCOPY; ZEOLITES;

AMORPHOUS FILMS;

AMORPHOUS ALUMINOSILICATE; NANOFILM; UNCLASSIFIED DRUG; ZEOLITE;

ARTICLE; PARTICLE SIZE; PROTON TRANSPORT; ROENTGEN SPECTROSCOPY; SCALE UP; SYNTHESIS; TEMPERATURE MEASUREMENT; X RAY DIFFRACTION;

EID: 70349895917     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja904627h     Document Type: Article

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