Addressing reliability and degradation of chemitransistor sensors by electrical tuning of the sensitivity

Scientific Reports

Volumn 3, Issue , 2013, Pages

  Lazzerini, G M ^a   Strambini, L M ^a   Barillaro, G ^a  

^a UNIVERSITY OF PISA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

NANOMATERIAL; NITROGEN DIOXIDE; SILICON;

ARTICLE; CHEMICAL STRUCTURE; CHEMISTRY; ELECTROCHEMICAL ANALYSIS; POROSITY; SEMICONDUCTOR;

ELECTROCHEMICAL TECHNIQUES; MODELS, MOLECULAR; NANOSTRUCTURES; NITROGEN DIOXIDE; POROSITY; SILICON; TRANSISTORS, ELECTRONIC;

MLCS; MLOWN;

EID: 84881434381     PISSN: None     EISSN: 20452322     Source Type: Journal    
DOI: 10.1038/srep01161     Document Type: Article

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