Hydrogen- and corrosion-induced defect characterization of ZnO single crystal: A slow positron beam study

Physica Status Solidi (A) Applications and Materials Science

Volumn 210, Issue 7, 2013, Pages 1418-1423

  Xue, Xu Dong ^a   Wang, Tao ^b   Jiang, Jing ^a   Wu, Yi Chu ^a  

^a WUHAN UNIVERSITY   (China)

^b NORTHWESTERN POLYTECHNICAL UNIVERSITY   (China)

Author keywords

corrosion; defects; hydrogen; positron annihilation; ZnO

Indexed keywords

DEFECT CHARACTERIZATION; ELECTROCHEMICAL CHARGING; HEXAGONAL PYRAMIDS; MICROSCOPY TECHNIQUE; NEAR BAND EDGE EMISSIONS; SLOW POSITRON BEAM; ZNO; ZNO SINGLE CRYSTALS;

CORROSION; DEFECTS; POSITRON ANNIHILATION; SINGLE CRYSTALS; SURFACE DEFECTS; ZINC OXIDE;

HYDROGEN;

EID: 84881380882     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.201329009     Document Type: Article

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