Metal defects sizing and detection under thick coating using microwave NDT

NDT and E International

Volumn 60, Issue , 2013, Pages 52-61

  Zhang, Hong ^a   Gao, Bin ^b   Tian, Gui Yun ^a,b   Woo, Wai Lok ^a   Bai, Libing ^b  

^a NEWCASTLE UNIVERSITY   (United Kingdom)

^b UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

Defect detection; Microwave; NDT; Open ended waveguide; Principle component analysis; Thick coating

Indexed keywords

DEFECT DETECTION; EXPERIMENTAL STUDIES; LINEAR SWEEP TECHNIQUE; OPEN ENDED WAVEGUIDES; PERFORMANCE COMPARISON; PRINCIPLE COMPONENT ANALYSIS; THICK COATINGS; WAVEGUIDE APERTURES;

COATINGS; DEFECTS; MICROWAVES; PRINCIPAL COMPONENT ANALYSIS; SIGNAL PROCESSING; THICKNESS MEASUREMENT; WAVEGUIDES;

NONDESTRUCTIVE EXAMINATION;

EID: 84881335664     PISSN: 09638695     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ndteint.2013.07.002     Document Type: Article

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