Fast crack profile reconstruction using pulsed eddy current signals

NDT and E International

Volumn 54, Issue , 2013, Pages 37-44

  Bai, Libing ^a,b   Tian, Gui Yun ^a,b   Simm, Anthony ^b   Tian, Shulin ^a   Cheng, Yuhua ^a  

^a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

^b NEWCASTLE UNIVERSITY   (United Kingdom)

Author keywords

Crack profile reconstruction; Pulsed eddy current; Spectral components; Transient slices

Indexed keywords

COMPARATIVE STUDIES; COMPUTING TIME; CRACK PROFILES; CRACK SHAPE; PROFILE RECONSTRUCTION; PULSED EDDY CURRENT; SPECTRAL COMPONENTS;

POWER QUALITY;

CRACKS;

EID: 84871757121     PISSN: 09638695     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ndteint.2012.11.003     Document Type: Article

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