An open-ended substrate integrated waveguide probe for detection and sizing of surface cracks in metals

NDT and E International

Volumn 53, Issue , 2013, Pages 36-38

  Mazlumi, F ^a   Gharanfeli, N ^b   Sadeghi, S H H ^b   Moini, R ^b  

^a Civil Aviation Technology College   (Iran)

^b AMIRKABIR UNIVERSITY OF TECHNOLOGY   (Iran)

Author keywords

Cracks; Microwave; Sizing; Waveguide

Indexed keywords

ENVELOPE DETECTORS; MICROWAVE PROBES; SIZING; SUBSTRATE INTEGRATED WAVEGUIDE TECHNOLOGIES; SURFACE CRACKS;

CRACK DETECTION; CRACKS; DETECTOR CIRCUITS; MICROWAVE CIRCUITS; MICROWAVE OSCILLATORS; MICROWAVES; PROBES; SURFACE DEFECTS; WAVEGUIDES;

SUBSTRATE INTEGRATED WAVEGUIDES;

EID: 84868521707     PISSN: 09638695     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ndteint.2012.10.004     Document Type: Article

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