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Volumn 111, Issue 3, 2013, Pages

Critical terrace width for two-dimensional nucleation during Si growth on Si(111)-(7×7) surface

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY E; ARRHENIUS DEPENDENCY; DIFFUSION LIMITED; REFLECTION ELECTRON MICROSCOPY; SCALING EXPONENT; SHAPE TRANSFORMATION; SUBSTRATE TEMPERATURE; TWO-DIMENSIONAL NUCLEATION;

EID: 84880589386     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.111.036105     Document Type: Article
Times cited : (34)

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