Diffraction studies under in situ electric field using a large-area hybrid pixel XPAD detector

Journal of Applied Crystallography

Volumn 46, Issue 4, 2013, Pages 1151-1161

  Fertey, Pierre ^a   Alle, Paul ^b   Wenger, Emmanuel ^b   Dinkespiler, Bernard ^c   Cambon, Olivier ^d   Haines, Julien ^d   Hustache, Stephanie ^a   Medjoubi, Kadda ^a   Picca, Frederic ^a   Dawiec, Arkadiusz ^c   Breugnon, Patrick ^e   Delpierre, Pierre ^c   Mazzoli, Claudio ^f   Lecomte, Claude ^b  

^a SYNCHROTRON SOLEIL   (France)

^b UNIVERSITÉ DE LORRAINE   (France)

^c CimXPAD SAS   (France)

^d UNIVERSITÉ DE MONTPELLIER   (France)

^e AIX MARSEILLE UNIVERSITÉ   (France)

^f POLITECNICO DI MILANO   (Italy)

Author keywords

hybrid pixel detectors; in situ electric field; X ray detectors; X ray diffraction

Indexed keywords

EXPERIMENTAL APPROACHES; EXPERIMENTAL METHODS; HYBRID PIXEL DETECTORS; PIEZOELECTRIC CRYSTALS; PIEZOELECTRIC TENSOR; STRUCTURAL VARIATIONS; TWO-DIMENSIONAL DETECTORS; X-RAY DETECTOR;

DETECTORS; PIEZOELECTRICITY; PIXELS; QUARTZ; SINGLE CRYSTALS; X RAY APPARATUS; X RAY DIFFRACTION;

ELECTRIC FIELDS;

EID: 84880560061     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889813013903     Document Type: Article

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