Diffraction study of the piezoelectric properties of low quartz

European Physical Journal B

Volumn 42, Issue 3, 2004, Pages 373-380

  Guillot, R ^a   Fertey, P ^a   Hansen, N K ^a   Alle P ^a   Elkaim E ^b   Lecomte, C ^a  

^a Nancy University CNRS   (France)

^b UNIVERSITÉ PARIS SACLAY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; ELECTRIC FIELDS; ELECTROMAGNETIC WAVE POLARIZATION; PIEZOELECTRICITY; X RAY DIFFRACTION ANALYSIS;

CHIRAL PROPERTIES; IONIC DISPLACEMENTS; STRUCTURAL DISTORTIONS;

QUARTZ;

EID: 11144291429     PISSN: 14346028     EISSN: None     Source Type: Journal    
DOI: 10.1140/epjb/e2004-00393-4     Document Type: Article

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