Diffraction measurements from crystals under electric fields: Instrumentation

Journal of Applied Crystallography

Volumn 35, Issue 3, 2002, Pages 360-363

  Guillot, Régis ^a   Allé, Paul ^a   Fertey, Pierre ^a   Hansen, Niels K ^a   Elkaïm, Eric ^a  

^a UNIVERSITÉ DE LORRAINE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; CRYSTAL; DENSITY; ELECTRIC FIELD; ELECTRICITY; ELECTRONICS; MEASUREMENT; PIEZOELECTRICITY; POLARIZATION; STROBOSCOPE; X RAY DIFFRACTION;

EID: 0036086167     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889802003278     Document Type: Article

References (5)