Combining near-field scanning optical microscopy with spectral interferometry for local characterization of the optical electric field in photonic structures

Optics Express

Volumn 21, Issue 14, 2013, Pages 16629-16638

  Tr̈agardh, Johanna ^a   Gersen, Henkjan ^a  

^a UNIVERSITY OF BRISTOL   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; ELECTRIC FIELDS; INTERFEROMETRY; NEAR FIELD SCANNING OPTICAL MICROSCOPY; REFRACTIVE INDEX;

DISPERSION PROPERTIES; LOCAL MEASUREMENT; PHOTONIC STRUCTURE; REFERENCE POINTS; SPECTRAL DOMAINS; SPECTRAL INTERFEROMETRY; TIME-DOMAIN INTERFEROMETRY; WAVEGUIDE STRUCTURE;

TIME DOMAIN ANALYSIS;

CONFOCAL MICROSCOPY; DEVICE FAILURE ANALYSIS; DEVICES; ELECTROMAGNETIC FIELD; EQUIPMENT DESIGN; INTERFEROMETRY; MATERIALS TESTING; PROCEDURES; REFRACTOMETRY; SURFACE PLASMON RESONANCE; SYSTEM ANALYSIS; ARTICLE; EQUIPMENT; EQUIPMENT FAILURE; METHODOLOGY;

ELECTROMAGNETIC FIELDS; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; INTERFEROMETRY; MATERIALS TESTING; MICROSCOPY, CONFOCAL; REFRACTOMETRY; SURFACE PLASMON RESONANCE; SYSTEMS INTEGRATION;

EID: 84880532798     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.21.016629     Document Type: Article

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