Polarization-sensitive near-field investigation of photonic crystal microcavities

Applied Physics Letters

Volumn 94, Issue 16, 2009, Pages

  Vignolini, Silvia ^a   Intonti, Francesca ^b   Riboli, Francesco ^a   Wiersma, Diederik S ^a   Balet, Laurent ^c   Li, Lianhe H ^c   Francardi, Marco ^d   Gerardino, Annamaria ^d   Fiore, Andrea ^e   Gurioli, Massimo ^b  

^a UNIVERSITY OF FLORENCE   (Italy)

^b CNISM   (Italy)

^c EPFL   (Switzerland)

^d CNR   (Italy)

^e EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

DETECTION MECHANISMS; DIFFRACTION LIMITS; ELECTRIC FIELD COMPONENTS; FINITE DIFFERENCE TIME DOMAIN SIMULATIONS; NEAR FIELDS; NEAR-FIELD MICROSCOPIES; NEAR-FIELD SCANNING OPTICAL MICROSCOPES; PHOTONIC CRYSTAL MICROCAVITIES; POLARIZATION CHANNELS; POLARIZATION SENSITIVES; SIMULTANEOUS ANALYSIS; TWO-DIMENSIONAL PHOTONIC CRYSTALS;

CRYSTAL ATOMIC STRUCTURE; ELECTRIC FIELDS; MICROCAVITIES; PHOTONIC CRYSTALS; PHOTORESISTS;

POLARIZATION;

EID: 65449156839     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3118578     Document Type: Article

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