Bivariate degradation analysis of products based on Wiener processes and copulas

Journal of Statistical Computation and Simulation

Volumn 83, Issue 7, 2013, Pages 1316-1329

  Pan, Zhengqiang ^a   Balakrishnan, Narayanaswamy ^b   Sun, Quan ^a   Zhou, Jinglun ^a  

^a NATIONAL UNIVERSITY OF DEFENSE TECHNOLOGY   (China)

^b MCMASTER UNIVERSITY   (Canada)

Author keywords

Bayesian MCMC method; bivariate degradation; copula function; performance characteristic; Wiener process

Indexed keywords

EID: 84880305330     PISSN: 00949655     EISSN: 15635163     Source Type: Journal    
DOI: 10.1080/00949655.2012.658805     Document Type: Article

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