Reliability assessment of the metallized film capacitors from degradation data

Microelectronics Reliability

Volumn 47, Issue 2-3, 2007, Pages 434-436

  Zhao, Jianyin ^a   Liu, Fang ^a  

^a Postgraduate Team of Naval Aeronautical Engineering Academy   (China)

Author keywords

[No Author keywords available]

Indexed keywords

FAILURE ANALYSIS; INERTIAL CONFINEMENT FUSION; MATHEMATICAL MODELS; METALLIZING; PARAMETER ESTIMATION; RELIABILITY; THIN FILMS;

DEGRADATION DATA; METALLIZED FILM PULSE CAPACITORS; OPERATIONAL RELIABILITY; RELIABILITY ASSESSMENT;

CAPACITORS;

EID: 33846601415     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2006.05.013     Document Type: Article

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