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Volumn 439, Issue 1, 2013, Pages
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Growth and interface properties of Au Schottky contact on ZnO grown by molecular beam epitaxy
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Author keywords
[No Author keywords available]
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Indexed keywords
CAPACITANCE;
CARRIER CONCENTRATION;
ELECTRIC RESISTANCE;
EPITAXIAL GROWTH;
MOLECULAR BEAM EPITAXY;
MOLECULAR BEAMS;
SCANNING ELECTRON MICROSCOPY;
X RAY DIFFRACTION;
ZINC OXIDE;
CONTACT PROPERTIES;
DENSITY OF INTERFACE STATE;
E BEAM EVAPORATION;
FREQUENCY-DEPENDENT CAPACITANCE;
INTERFACE PROPERTY;
INVERSE PROPORTIONS;
MEASURING FREQUENCY;
SERIES RESISTANCES;
INTERFACE STATES;
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EID: 84880259283
PISSN: 17426588
EISSN: 17426596
Source Type: Conference Proceeding
DOI: 10.1088/1742-6596/439/1/012031 Document Type: Conference Paper |
Times cited : (19)
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References (12)
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