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Volumn 439, Issue 1, 2013, Pages

Growth and interface properties of Au Schottky contact on ZnO grown by molecular beam epitaxy

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CARRIER CONCENTRATION; ELECTRIC RESISTANCE; EPITAXIAL GROWTH; MOLECULAR BEAM EPITAXY; MOLECULAR BEAMS; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION; ZINC OXIDE;

EID: 84880259283     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/439/1/012031     Document Type: Conference Paper
Times cited : (19)

References (12)
  • 11
    • 0001168597 scopus 로고
    • 10.1016/0038-1101(85)90003-6 0038-1101
    • Sing A 1985 Solid-State Electron. 28 233
    • (1985) Solid-State Electron. , vol.28 , Issue.3 , pp. 233
    • Sing, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.