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Physical Review Letters

Volumn 111, Issue 2, 2013, Pages

Layer-resolved study of Mg atom incorporation at the MgO/Ag(001) buried interface

(7) Jaouen, T a,b Tricot, S b Delhaye, G b Lepine B b Sebilleau D b Jezequel G b Schieffer, P b

a UNIVERSITY OF FRIBOURG (Switzerland)

b UNIVERSITÉ DE RENNES 1 (France)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON DIFFRACTIONS; AUGER TRANSITIONS; BAND-BENDING EFFECTS; BAND-OFFSET; BURIED INTERFACE; MGO FILMS; MULTIPLE SCATTERING CALCULATIONS; SUBSTANTIAL REDUCTION;

AUGER ELECTRON SPECTROSCOPY; MAGNESIA; OXIDE FILMS; ULTRATHIN FILMS;

INTERFACES (MATERIALS);

EID: 84880179329 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.111.027601 Document Type: Article

Times cited : (21)

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