Variable range hopping in single-wall carbon nanotube thin films: A processing-structure-property relationship study

Langmuir

Volumn 29, Issue 27, 2013, Pages 8694-8702

  Luo, Sida ^a   Liu, Tao ^a   Benjamin, Shermane M ^b   Brooks, James S ^b  

^a FAMU FSU COLLEGE OF ENGINEERING   (United States)

^b FLORIDA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERISTIC TEMPERATURE; ELECTRICAL MEASUREMENT; ELECTRON LOCALIZATIONS; PROCESSING-STRUCTURE-PROPERTY RELATIONSHIPS; SINGLEWALLED CARBON NANOTUBE (SWCNT); STRUCTURAL INFORMATION; TEMPERATURE DEPENDENT; VARIABLE RANGE HOPPING;

DISPERSIONS; DYNAMIC LIGHT SCATTERING; FILM THICKNESS; SINGLE-WALLED CARBON NANOTUBES (SWCN); THIN FILMS; THREE DIMENSIONAL;

FILM PREPARATION;

CARBON NANOTUBE;

ARTICLE; CHEMICAL STRUCTURE; CHEMISTRY; TEMPERATURE;

MOLECULAR STRUCTURE; NANOTUBES, CARBON; TEMPERATURE;

EID: 84880152288     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la401264r     Document Type: Article

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