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Volumn 45, Issue 8, 2013, Pages 1206-1210

The investigation of NbO2 and Nb2O5 electronic structure by XPS, UPS and first principles methods

(9) Weibin, Zhang a,b,c Weidong, Wu b Xueming, Wang b Xinlu, Cheng c Dawei, Yan b,c Changle, Shen b Liping, Peng b Yuying, Wang b Li, Bai b

a RESEARCH CENTER OF LASER FUSION (China)

b CHENGDU UNIVERSITY OF TECHNOLOGY (China)

c SICHUAN UNIVERSITY (China)

Author keywords

density of state; Nb film; ultraviolet photoelectron spectroscopy; X ray photoelectron spectroscopy

Indexed keywords

DENSITY OF STATE; FIRST PRINCIPLES METHOD; NB FILM;

ELECTRONIC STRUCTURE; PHOTOELECTRON SPECTROSCOPY; PHOTOELECTRONS; ULTRAVIOLET PHOTOELECTRON SPECTROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

NIOBIUM OXIDE;

EID: 84880131589 PISSN: 01422421 EISSN: 10969918 Source Type: Journal
DOI: 10.1002/sia.5253 Document Type: Article

Times cited : (126)

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