Single shot longitudinal bunch profile measurements at FLASH using electro-optic techniques

EPAC 2006 - Contributions to the Proceedings

Volumn , Issue , 2006, Pages 1055-1057

  Berden, G ^a   Van Der Meer, A F G ^a   Jamison, S P ^b   Steffen, B ^c   Knabbe, E A ^c   Schmidt, B ^c   Schmuser P ^c   MacLeod, A M ^d   Phillips, P J ^e   Gillespie, W A ^e  

^a FOM INSTITUTE FOR PLASMA PHYSICS RIJNHUIZEN   (Netherlands)

^b DARESBURY LABORATORY   (United Kingdom)

^c DESY   (Germany)

^d UNIVERSITY OF ABERTAY DUNDEE   (United Kingdom)

^e UNIVERSITY OF DUNDEE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; ELECTRONS; LASER PULSES; PARTICLE BEAM BUNCHING;

ELECTRIC FIELD PROFILES; ELECTRO-OPTIC TECHNIQUES; ELECTROOPTIC CRYSTALS; HIGH-PEAK CURRENTS; PROFILE MEASUREMENT; SECOND-HARMONIC CRYSTALS; SINGLE-SHOT MEASUREMENTS; SUPERCONDUCTING LINAC;

DECODING;

EID: 84879973843     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

1. M. Hüning, A. Bolzmann, H. Schlarb, J. Frisch, D. Mc-Cormick, M. Ross, T. Smith, J. Rossbach, Observation of femtosecond bunch length using a transverse deflecting structure, Proceedings of the 27th International Free Electron Laser Conference (FEL 2005), Stanford, USA 2005, p. 538.
2. H. Delsim-Hashemi, O. Grimm, J. Rossbach, H. Schlarb, B. Schmidt, P. Schmüser, and A.F.G. van der Meer. Broadband single shot spectrometer, Proceedings of the 27th International Free Electron Laser Conference (FEL 2005), Stanford, USA 2005, p. 514.
3. H. Delsim-Hashemi, J. Rossbach, P. Schmüser, O. Grimm, H. Schlarb, B. Schmidt, and A.F.G. van der Meer. Bunch compression monitor, EPAC 2006, MOPCH016.
4. G. Berden, A.F.G. van der Meer, S.P. Jamison, B. Steffen, E.-A. Knabbe, B. Schmidt, P. Schmüser, A.M. MacLeod, P.J. Phillips, and W.A. Gillespie. Time resolved single-shot measurements of transition radiation at the THz beamline of FLASH using electro-optic spectral decoding, EPAC 2006, TUPCH027.
5. G. Berden, S.P. Jamison, A.M. MacLeod,W.A. Gillespie, B. Redlich, and A.F.G. van der Meer, Electro-optic technique with improved time resolution for real-time, nondestructive, single-shot measurements of femtosecond electron bunch profiles, Phys. Rev. Lett. 93, 114802 (2004).
6. I. Wilke, A.M. MacLeod, W.A. Gillespie, G. Berden, G.M.H. Knippels, and A.F.G. van der Meer. Single-shot electron-beam bunch length measurements, Phys. Rev. Lett. 88, 124801 (2002).
7. B. Steffen, S. Casalbuoni, E.-A. Knabbe, B. Schmidt, P. Schmüser, and A. Winter. Spectral decoding electro-optic measurements for longitudinal bunch diagnostics at the DESY VUV-FEL, Proceedings of the 27th International Free Electron Laser Conference (FEL 2005), Stanford, USA 2005, p. 549.
8. B. Steffen, S. Casalbuoni, E.-A. Knabbe, H. Schlarb, B. Schmidt, P. Schmüser, and A. Winter. Electro optic bunch length measurements at the VUV-FEL at DESY, Proceedings of 2005 Particle Accelerator Conference (PAC2005), Knoxville, Tennessee, USA, 2005, p. 3111.