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Physical Review Letters

Volumn 88, Issue 12, 2002, Pages 1248011-1248014

Single-shot electron-beam bunch length measurements

(6) Wilke, I a MacLeod, A M b Gillespie, W A b Berden, G c Knippels, G M c van der Meer, A F c

a UNIVERSITY OF HAMBURG (Germany)

b UNIVERSITY OF ABERTAY DUNDEE (United Kingdom)

c FOM INSTITUTE FOR PLASMA PHYSICS RIJNHUIZEN (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROOPTICAL EFFECTS; IMAGING TECHNIQUES; LASER PULSES; PARTICLE BEAM BUNCHING; SPECTRUM ANALYSIS;

ELECTRON-BEAM BUNCHES; SINGLE-SHOT IMAGING;

ELECTRON BEAMS;

EID: 0037171206 PISSN: 00319007 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (289)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.