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Volumn 2005, Issue , 2005, Pages 3111-3113

Electro optic bunch length measurements at the VUV-FEL at DESY

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRO OPTIC SAMPLING (EOS); FEMTOSECOND LASER PULSES; SUPER CONDUCTING LINACS; SYNCHRONIZATION STABILITY;

EID: 33847126617     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PAC.2005.1591381     Document Type: Conference Paper
Times cited : (9)

References (7)
  • 1
    • 33847106887 scopus 로고    scopus 로고
    • Picosecond electronbunch length measurement using an electro-optic sensor
    • Hamburg
    • D. Oepts et al. Picosecond electronbunch length measurement using an electro-optic sensor. In Proceedings of the 21st International FEL Conference, Hamburg, 1999.
    • (1999) Proceedings of the 21st International FEL Conference
    • Oepts, D.1
  • 2
    • 33847116773 scopus 로고
    • Electro-optic sampling at the TESLA test accelerator: Experimental setup and first results
    • TESLA Report, 2003
    • M. Brunken et al. Electro-optic sampling at the TESLA test accelerator: experimental setup and first results. TESLA Report 2003-11, 2003.
    • (1911)
    • Brunken, M.1
  • 6
    • 33847097404 scopus 로고    scopus 로고
    • private communication
    • M. Hüning and A. Bolzmann, private communication, 2005.
    • (2005)
    • Hüning, M.1    Bolzmann, A.2
  • 7
    • 0037171206 scopus 로고    scopus 로고
    • Single-shot electron-beam bunch length measurements
    • I. Wilke et al. Single-shot electron-beam bunch length measurements. Phys. Rev. Lett., 88:124801-1, 2002.
    • (2002) Phys. Rev. Lett , vol.88 , pp. 124801-124801
    • Wilke, I.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.