Electro-optic technique with improved time resolution for real-time, nondestructive, single-shot measurements of femtosecond electron bunch profiles

Physical Review Letters

Volumn 93, Issue 11, 2004, Pages

  Berden, G ^a   Jamison, S P ^b,c   MacLeod, A M ^b   Gillespie, W A ^b   Redlich, B ^a   Van der Meer, A F G ^a  

^a FOM INSTITUTE FOR PLASMA PHYSICS RIJNHUIZEN   (Netherlands)

^b UNIVERSITY OF ABERTAY DUNDEE   (United Kingdom)

^c UNIVERSITY OF STRATHCLYDE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

BIREFRINGENCE; COMPUTATIONAL METHODS; ELECTRIC FIELD EFFECTS; ELECTRON BEAMS; ELLIPSOMETRY; FREE ELECTRON LASERS; PLASMAS; SECOND HARMONIC GENERATION; SPECTRUM ANALYSIS; ULTRASHORT PULSES;

FEMTOSECOND ELECTRON BUNCHES; FULL WIDTH AT HALF-MAXIMUM (FWHM); OPTICAL PULSES; SPECTRAL DECODING;

ELECTROOPTICAL EFFECTS;

EID: 19644390408     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.93.114802     Document Type: Article

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