Polarization-dependent and ellipsometric infrared microscopy for analysis of anisotropic thin films

Journal of Physical Chemistry C

Volumn 117, Issue 26, 2013, Pages 13557-13563

  Hinrichs, Karsten ^a   Furchner, Andreas ^a   Rappich, Jörg ^b   Oates, Thomas W H ^a  

^a LEIBNIZ INSTITUT FÜR ANALYTISCHE WISSENSCHAFTEN ISAS E V   (Germany)

^b HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPIC THIN FILMS; DIELECTRIC FUNCTIONS; ELECTRONIC CONDUCTIVITY; ELLIPSOMETRIC MEASUREMENTS; ELLIPSOMETRIC MICROSCOPY; FOURIER TRANSFORM INFRA REDS; INFRARED MICROSCOPY; QUANTITATIVE DETERMINATIONS;

ANISOTROPY; ELLIPSOMETRY; PHASE MEASUREMENT; POLARIZATION; POLYIMIDES; POLYMERIC FILMS; SENSORS; SILICON OXIDES; THIN FILMS;

FOURIER TRANSFORM INFRARED SPECTROSCOPY;

EID: 84879831928     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp401576r     Document Type: Article

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