Mapping of QTL lengthening the latent period of Puccinia striiformis in winter wheat at the tillering growth stage

European Journal of Plant Pathology

Volumn 136, Issue 4, 2013, Pages 715-727

  Quan, Wei ^a   Hou, Guangliang ^a   Chen, Jiang ^a   Du, Ziyi ^a   Lin, Feng ^a   Guo, Yan ^a   Liu, Song ^a   Zhang, Zhongjun ^a  

^a China Agricultural University West Campus ^*  (China)

Author keywords

DNA marker; Quantitative resistance; Slow rusting; Stripe rust; Triticum aestivum L

Indexed keywords

DISEASE RESISTANCE; DNA; FUNGAL DISEASE; GENE EXPRESSION; GENETIC MARKER; GROWTH RATE; MAPPING METHOD; PHENOTYPE; QUANTITATIVE ANALYSIS; RECOMBINATION; WHEAT; WINTER;

PUCCINIA STRIIFORMIS; PUCCINIA STRIIFORMIS F. SP. TRITICI; TRITICUM AESTIVUM;

EID: 84879780360     PISSN: 09291873     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10658-013-0201-z     Document Type: Article

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