Quantitative trait loci for resistance against yellow rust in two wheat-derived recombinant inbred line populations

Theoretical and Applied Genetics

Volumn 104, Issue 1, 2002, Pages 111-118

  Boukhatem, N ^a,c   Baret, P V ^b   Mingeot, D ^a   Jacquemin, J M ^a  

^a WALLOON AGRICULTURAL RESEARCH CENTRE   (Belgium)

^b UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

^c FACULTÉ DES SCIENCES   (Morocco)

Author keywords

Durable resistance; QTL mapping; Wheat; Yellow rust

Indexed keywords

DISEASES; GENES; GENETIC ENGINEERING; PATHOLOGY;

PATHOGEN ADAPTION; RESISTANCE GENES;

GRAIN (AGRICULTURAL PRODUCT);

EMBRYOPHYTA; PUCCINIA STRIIFORMIS F. SP. TRITICI; TRITICUM AESTIVUM;

EID: 0347297278     PISSN: 00405752     EISSN: None     Source Type: Journal    
DOI: 10.1007/s001220200013     Document Type: Article

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