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Volumn 117, Issue , 2013, Pages 209-213

Microstructure analysis of the interface situation and adhesion of thermally formed nickel silicide for plated nickel-copper contacts on silicon solar cells

Author keywords

Adhesion; Copper; Metallization; Nickel; Plating; Silicide formation

Indexed keywords

ADHESION PROMOTION; METAL-SILICON INTERFACES; MICROSTRUCTURAL ANALYSIS; MICROSTRUCTURE ANALYSIS; NICKEL SILICIDE; SILICIDE FORMATION; THERMAL FORMATION; THERMAL-ANNEALING;

EID: 84879623347     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2013.06.005     Document Type: Article
Times cited : (77)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.