Band-bending at buried SiO2/Si interface as probed by XPS

ACS Applied Materials and Interfaces

Volumn 5, Issue 12, 2013, Pages 5875-5881

  Çopurogìlu, Mehmet ^a   Sezen, Hikmet ^a   Opila, Robert L ^b   Suzer, Sefik ^a  

^a BILKENT UNIVERSITY   (Turkey)

^b UNIVERSITY OF DELAWARE   (United States)

Author keywords

band bending; buried interface; doping; photovoltage; XPS

Indexed keywords

BANDBENDING; BURIED INTERFACE; NUMBER OF SAMPLES; ORGANIC LAYERS; OXIDATION ROUTE; PHOTO-INDUCED; PHOTO-VOLTAGE; THIN ORGANIC LAYERS;

ANODIC OXIDATION; BINDING ENERGY; DOPING (ADDITIVES); PHOTOELECTRONS; SILICON; SILICON WAFERS; X RAY PHOTOELECTRON SPECTROSCOPY;

INTERFACE STATES;

EID: 84879547499     PISSN: 19448244     EISSN: 19448252     Source Type: Journal    
DOI: 10.1021/am401696e     Document Type: Article

References (37)

1. Zhang, X. G. Electrochemistry of Silicon and Its Oxide; Kluwer Academics: Plenum, NY, 2001.
2. Zhang, Z.; Yates, J. T. Chem. Rev. 2012, 112, 5520-5551
3. Forzani, E. S.; Li, X.; Tao, N. Anal. Chem. 2007, 79, 5217-5224
4. Vehoff, T.; Chung, Y. S.; Johnston, K.; Troisi, A.; Yoon, D. Y.; Andrienko, D. J. Phys. Chem. C 2010, 114, 10592-10597
5. Teo, B. K.; Sun, X. H. Chem. Rev. 2007, 107, 1454-1532
6. Nakamura, M.; Nagai, A.; Hentunen, T.; Salonen, J.; Sekjima, Y.; Okura, T.; Hashimoto, K.; Toda, Y.; Monma, H.; Yamashita, K. ACS Appl. Mater. Interfaces 2009, 1, 2181-2189
7. Wodka, D.; Bielariska, E.; Socha, R. P.; Elzbieciak-Wodka, M.; Gurgul, J.; Nowak, P.; Warszyriski, P.; Kumakiri, I. ACS Appl. Mater. Interfaces 2010, 2, 1945-1953
8. Munro, A. M.; Zacher, B.; Graham, A.; Armstrong, N. R. ACS Appl. Mater. Interfaces 2010, 2, 863-869
9. Natu, G.; Hasin, P.; Huang, Z.; Ji, Z.; He, M.; Wu, Y. ACS Appl. Mater. Interfaces 2012, 4, 5922-5929
10. Benson, M. C.; Ruther, R, E; gerken, J. B.; Rigsby, M. L.; Bishop, L. M.; Tan, Y.; Stahl, S. S.; Hamers, R. J. ACS Appl. Mater. Interfaces 2011, 3, 3110-3119
11. Schoell, S. J.; Sachsenhauser, M.; Oliveros, A.; Howgate, J.; Stutzmann, M.; Brandt, M. S.; Frewin, C. L.; Saddow, S. E.; Sharp, I. D. ACS Appl. Mater. Interfaces 2013, 5, 1393-1399
12. Fabre, B.; Hennous, L.; Ababou-Girard, S.; Meiadec, C. ACS Appl. Mater. Interfaces 2013, 5, 338-343
13. Demuth, J. E.; Thompson, W. J.; DiNardo, N. J.; Imbihl, R. Phys. Rev. Lett. 1986, 56, 1408-1411
14. Halas, N. J.; Bokor, J. Phys. Rev. Lett. 1989, 62, 1679-1682
15. Long, J. P.; Sadeghi, H. R.; Rife, J. C.; Kabler, M. N. Phys. Rev. Lett. 1990, 64, 1158-1161
16. Kronik, L.; Shapira, Y. Surf. Sci. Rep. 1999, 37, 1-206
17. Kraut, E. A.; Grant, R. W.; Waldrop, J. R.; Kowalczyk, S. P. Phys. Rev. Lett. 1980, 44, 1620-1623
18. Himpsel, F. J.; Hollinger, G.; Pollak, R. A. Phys. Rev. B 1983, 28, 7014-7018
19. Sezen, H.; Suzer, S. J. Chem. Phys. 2011, 135, 141102-4
20. Suzer, S.; Sezen, H.; Ertas, G.; Dana, A. J. Electron Spectrosc. Relat. Phenom. 2010, 176, 52-57
21. Sezen, H.; Ozbay, E.; Aktas, O.; Suzer, S. Appl. Phys. Lett. 2011, 98, 111901-3
22. Sezen, H.; Suzer, S. Surf. Sci. 2010, 604, L59-L62
23. Marsi, M.; Nahon, L.; Couprie, M. E.; Garzella, D.; Hara, T.; Bakker, R.; Billardon, M.; Delboulbe, A.; Indlekofer, G.; Taleb-Ibrahimi, A. J. Electron Spectrosc. Relat. Phenom. 1998, 94, 149-157
24. Widdra, W.; Brocker, D.; Giessel, T.; Hertel, I. V.; Kruger, W.; Liero, A.; Noack, F.; Petrov, V.; Pop, D.; Schmidt, P. M.; Weber, R.; Will, I.; Winter, B. Surf. Sci. 2003, 543, 87-94
25. Marsi, M.; Couprie, M. E.; Nahon, L.; Garzella, D.; Bakker, R.; Delboulbe, A.; Nutarelli, D.; Roux, R.; Visentin, B.; Grupp, C.; Indlekofer, G.; Panaccione, G.; TalebIbrahimi, A.; Billardon, M. Nucl. Instrum. Meth, A 1997, 393, 548-551
26. Marsi, M.; Couprie, M. E.; Nahon, L.; Garzella, D.; Hara, T.; Bakker, R.; Billardon, M.; Delboulbe, A.; Indlekofer, G.; Taleb Ibrahimi, A. Appl. Phys. Lett. 1997, 70, 895-897
27. Marsi, M.; Belkhou, R.; Grupp, C.; Panaccione, G.; Taleb-Ibrahimi, A.; Nahon, L.; Garzella, D.; Nutarelli, D.; Renault, E.; Roux, R.; Couprie, M. E.; Billardon, M. Phys. Rev. B 2000, 61, R5070-R5073
28. Brocker, D.; Giessel, T.; Widdra, W. Chem. Phys. 2004, 299, 247-251
29. Sezen, H.; Ertas, G.; Dana, A.; Suzer, S. Macromolecules 2007, 40, 4109-4112
30. Birer, O.; Sayan, S.; Suzer, S.; Aydinli, A. J. Mol. Struct. 1999, 480-481, 611-614
31. Briggs, D.; Seah, M. P. 2, Practical Surface Analysis, 1, Wiley: Chichester, U. K., 1996.
32. Hirose, K.; Nohira, H.; Azuma, K.; Hattori, T. Prog. Surf. Sci. 2007, 82, 3-54
33. Šarapatka, T. J. Surf. Sci. 1992, 275, 443-449
34. Iwata, S.; Ishizaka, A. J. Appl. Phys. 1996, 79, 6653-6713
35. Lau, W. M. J. Appl. Phys. 1990, 67, 1504-1509
36. Beamson, G.; Briggs, D. High Resolution XPS of Organic Polymers: the Scienta ESCA300 Database, Vol. 4; Wiley: Chichester, U. K., 1992.
37. Oplia, R. L.; Wilk, G. D.; Alam, M. A.; van Dover, R. B. Appl. Phys. Lett. 2002, 81, 1788-1790