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Volumn 1, Issue 18, 2013, Pages 3091-3097

Electrically and thermally stable gate dielectrics from thiol-ene cross-linked systems for use in organic thin-film transistors

(4) Ko, Jung Min a Kang, Young Hun a Lee, Changjin a Cho, Song Yun a

a Korea Research Institute of Chemical Technology (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CROSSLINKED STRUCTURES; ENVIRONMENTAL STABILITY; GATE DIELECTRIC LAYERS; HIGH DIELECTRIC CONSTANTS; INSULATING PROPERTIES; ORGANIC THIN FILM TRANSISTOR (OTFTS); ORGANIC THIN FILM TRANSISTORS; THRESHOLD-VOLTAGE SHIFT;

ELECTRIC PROPERTIES; FUNCTIONAL GROUPS; THERMODYNAMIC STABILITY; THIN FILM TRANSISTORS;

GATE DIELECTRICS;

EID: 84879540338 PISSN: 20507534 EISSN: 20507526 Source Type: Journal
DOI: 10.1039/c3tc30297k Document Type: Article

Times cited : (37)

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