|
Volumn 112, Issue , 2013, Pages 31-34
|
Memristive behavior of ZnO/NiO stacked heterostructure
|
Author keywords
I V hysteresis; Memristive; ZnO NiO
|
Indexed keywords
CURRENT-VOLTAGE MEASUREMENTS;
ELEVATED TEMPERATURE;
MEMRISTIVE;
MEMRISTIVE BEHAVIOR;
ROOM TEMPERATURE;
STACKED STRUCTURE;
ULTRASONIC PYROLYSIS;
ZNO;
MAGNETIC MATERIALS;
MICROELECTRONICS;
OXYGEN VACANCIES;
|
EID: 84879493072
PISSN: 01679317
EISSN: None
Source Type: Journal
DOI: 10.1016/j.mee.2013.05.018 Document Type: Article |
Times cited : (18)
|
References (21)
|